From high density printed circuit boards, IC package parts, and electronic parts to large FPD panels, the Sinto S-Precision standard series plays an active role in a wide variety of fields requiring size dimension control. AMIC came about from minute mechanical design pursuing of essential accuracy, and R&D and production site have continued to rely on it for many years.
AMIC-300/360/361
A small model that is optimal for the dimension control of IC package parts such as fine-patterned lead frames, BGAs/CSPs, and TCPs/TABs. In addition to our AMIC-360 model that has delivered solid results and our high-precision AMIC-361model, our lineup includes the AMIC-300 model, which has a renewed measuring area and accuracy.
| Model | Measurement Range X,Y (Z) | X,Y Repeatability |
|---|---|---|
| AMIC-300 | 300×300 (×60）mm | 3σ≦0.9μm |
| AMIC-360 | 360×360 (×60）mm | 3σ≦0.7μm |
| AMIC-361 | 360×360 (×60）mm | 3σ≦0.5μm |
※Z-axis measurement range；In case that laser auto-focus microscope (Option) is selected.
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- IC Packages
- Fiber Optic Connectors
- LED related parts
AMIC-710/810
The AMIC-710 is the AMIC Series’ best selling model, having earned its users’ trust by means of its wide measurements of items ranging from high-density electronic parts, such as PCBs and MLCCs, to FPDs and touchscreens. Its technological components – a cast-iron body, a high-straightness linear guide, and a center-drive mechanism – make AMIC a special one. Besides, AMIC-810 have been lined up corresponding to the size of 4.5 generation LCD.
| Model | Measurement Range X,Y (Z) | X,Y Repeatability |
|---|---|---|
| AMIC-710 | 700×800 (×100）mm | 3σ≦0.9μm |
| AMIC-810 | 740×930 (×100）mm | 3σ≦0.9μm |
※Z-axis measurement range；In case that laser auto-focus microscope (Option) is selected.
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- high-density PCBs
- Film /Metal/Screen masks
- MLCCs
- Touchscreens
- 4.5-generation LCD panels
AMIC Large Models (1400/1700/1710/2100/2500/2600)
With dual linear motors*1, table flatness adjustment mechanism, and minute-correction technology, based on a large measuring area, we have created a highly reliable measurement coordination system.
*1 Limited to models 1710 and up
| Model | Measurement Range X,Y (Z) | X,Y Repeatability |
|---|---|---|
| AMIC-1400 | 1400×1400 (×60）mm | 3σ≦2.0μm |
| AMIC-1700 | 1700×1700 (×100）mm | 3σ≦2.0μm |
| AMIC-1710 | 1900×1700 (×100）mm | 3σ≦2.5μm |
| AMIC-2100 | 2100×1700 (×100）mm | 3σ≦2.5μm |
| AMIC-2500 | 2100×2500 (×80）mm | 3σ≦2.5μm |
| AMIC-2600 | 2600×2250 (×100）mm | 3σ≦3.5μm |
※Z-axis measurement range；In case that laser auto-focus microscope (Option) is selected.
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- FPD panels
- FPD bare glass
- Photomasks
- FPD films
- Laser Autofocus Microscope
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Through the use of our company’s knife-edge method laser auto focus, real-time focus is obtained in a minimal span of time, which shortens the measuring cycle time. By using it as a laser displacement meter , it can measure the height of the object and the profile of its surface shape.
- Programmable Multi-lighting (PML lighting)
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It is possible to choose from 4 directions and 3 angles of oblique lighting depending on the shape of the object being measured. Measuring patterns that is hard to detect by the standard illumination is possible by casting the shadow on the edges of step or tapered area.
(the irradiation angle is subject to change depending on the objective lens.)
- Color Image Processing
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By applying grayscale image processing to each RGB color on an image taken from a 3CCD camera, it is possible to detect edges that are hard to discern in a monochromatic image.
In addition, it can be used to do surface observations in color as well as image sampling.
- Revolving microscope(Only supported by AMIC)
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Up to 5 types of objective lenses can be mounted on this microscope’s revolving nosepiece. It can support a wide variety of uses, from detailed pattern measurements made from high-density images to surface observations made from wide viewing angles.
- Dual-View Microscopes
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We can provide an additional microscope along with a standard microscope with two magnification settings (high/low). Specifications such as alignment, wide-view observation specifications, and laser AF specifications for height/displacement measurement can be configured according to the purpose.
- Lighting Options
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It is possible to choose from many lighting options, depending on the object being measured, to attain illumination that will yield the ideal image.
・Short-wavelength LED lighting (for ITO measurements)
・UV lighting (for measurements and observations of organic EL vapor-deposited films)※We can provide support for other options upon request.
